Today, I joined The President's Lecture Series: Excellence in Academia entitled "Reliability Challenges Using Nano Technologies" in the City University of Hong Kong.
Firstly, Prof. Way Kuo (President and University Distinguished Professor, CityUHK) briefed the history of semiconductor development and commented there was a Nano Technology Era.
Then he gave two questions about Reliability and Nano Technology.
l Are we ready to produce and to use the nano devices-based system?
l How can we deal with the reliability and security problems which are some of the key concerns of nano technology?
After that Prof. Kuo pointed out four challenges.
The first challenge was "Failure Mechanisms". There were six points and the last point was "Design of System". Prof. Kuo said many failure cause was unknown.
Some failure examples were shown.
The second challenge was "Yield Enhancement".
Yield model for wafer (using a point-process model)
The third challenge was "Data Availability". It was included Scarcity of data, Secrecy of data and Interpretation of Data. For large amount of data, Data Mining would be employed.
Then Prof. Kuo commented how accuracy of the Moore's Law.
Bayesian Approach was introduced for predicting semiconductor lifetime.
The forth challenge was "Keeping up with The New Technologies".
After that President predicted the future computer as below. (It could be folded into small size.)
Lastly, President concluded into two words. They were "Simplicity" and "Compatibility".
Before the lecture, we had a light lunch. I met Prof. Fugee Tsung (ISE, HKUST) and took a photo for memory.
Reference:
Distinguished lectures - President tackles reliability issues in hi-tech world: http://wikisites.cityu.edu.hk/sites/newscentre/en/Pages/201103041701.aspx
Prof. Way Kuo named International Academy for Quality (IAQ) Academician Emeritus: http://qualityalchemist.blogspot.com/2010/02/prof-way-kuo-named-iaq-academician.html
International Academy for Quality (IAQ): http://iaq.asq.org/
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